Kernel Smoothing Technique Based on Multiple-Coordinate System for Screening Potential Failures in NAND Flash Memory
Author:
Affiliation:
1. Samsung Electronics,Flash Product Engineering Team,Hwasung-si,Rep. of Korea
2. Samsung Electronics,Flash Product & Technology,Hwasung-si,Rep. of Korea
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10139918/10139926/10139974.pdf?arnumber=10139974
Reference13 articles.
1. Development of 7th generation 3D VNAND Flash Product with COP structure for Growing Demand in Storage Market
2. Highly-Reliable Cell Characteristics with 128-Layer Single-Stack 3D-NAND Flash Memory;park;2021 Symp on VLSI Tech,2021
3. Kernel based clustering for quality improvement and excursion detection
4. Remarks on Some Nonparametric Estimates of a Density Function
5. Guidelines for part average testing (PAT),2003
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