A New Scheme to Extract PUF Information by Scan Chain

Author:

Cui Aijiao,Zhou Wei,Qu Gang,Li Huawei

Publisher

IEEE

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Modeling Attack Tests and Security Enhancement of the Sub-Threshold Voltage Divider Array PUF;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25

2. A Low-overhead PUF-based Secure Scan Design;2023 24th International Symposium on Quality Electronic Design (ISQED);2023-04-05

3. Building Hardware Security Primitives Using Scan-based Design-for-Testability;2022 IEEE 65th International Midwest Symposium on Circuits and Systems (MWSCAS);2022-08-07

4. How to Retrieve PUF Response from a Fabricated Chip Securely?;2020 21st International Symposium on Quality Electronic Design (ISQED);2020-03

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