Author:
Sengar Gaurav,Mukhopadhyay Debdeep,Chowdhury Dipanwita Roy
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
69 articles.
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1. Design-for-Testability and Its Impact on Logic Locking;Understanding Logic Locking;2023-09-23
2. Invisible Scan for Protecting Against Scan-Based Attacks: You Can't Attack What You Can't See;2023 IEEE International Test Conference India (ITC India);2023-07-23
3. On Evaluating the Security of Dynamic Scan Obfuscation Scheme;2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS);2023-07-03
4. High-Level Approaches to Hardware Security: A Tutorial;ACM Transactions on Embedded Computing Systems;2023-04-20
5. An obfuscation scheme of scan chain to protect the cryptographic chips;2022 IEEE 31st Asian Test Symposium (ATS);2022-11