Author:
Ahmed Nisar,Tehranipoor Mohammad,Ravikumar C. P.,Butler Kenneth M.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
24 articles.
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1. Topping Off Test Sets Under Bounded Transparent Scan;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-01
2. Compaction of Compressed Bounded Transparent-Scan Test Sets;Proceedings of the Great Lakes Symposium on VLSI 2022;2022-06-06
3. Equivalent Faults under Launch-on-Shift (LOS) Tests with Equal Primary Input Vectors;ACM Transactions on Design Automation of Electronic Systems;2021-04
4. Single Test Type to Replace Broadside and Skewed-Load Tests for Transition Faults;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-02
5. Broadside Tests for Transition and Stuck-At Faults;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-08