Author:
Zaourar Lilia,Kieffer Yann,Wenzel Arnaud
Cited by
2 articles.
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1. An Efficient Grouping Algorithm with Build-in-Self-Test for Multiple Memories;2024 2nd International Symposium of Electronics Design Automation (ISEDA);2024-05-10
2. Applying Operations Research to Design for Test Insertion Problems;Computational Intelligence in Digital and Network Designs and Applications;2015