Gated Homogeneous Fusion Networks With Jointed Feature Extraction for Defect Prediction
Author:
Affiliation:
1. Graduate School of Advanced Science and Engineering, Hiroshima University, Hiroshima, Japan
Funder
ROIS NII
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Link
http://xplorestaging.ieee.org/ielx7/24/9787285/09765381.pdf?arnumber=9765381
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