A 30.2-µ Vrms Horizontal Streak Noise 8.3-Mpixel 60-Frames/s CMOS Image Sensor With Skew-Relaxation ADC and On-Chip Testable Ramp Generator for Surveillance Camera

Author:

Morishita Fukashi1ORCID,Saito Wataru1ORCID,Iizuka Yoichi1,Kato Norihito1,Otake Ryota1,Ito Masao1

Affiliation:

1. Renesas Electronics Corporation, Kodaira, Japan

Funder

Renesas Electronics Corporation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Reference37 articles.

1. An ADC Test Technique With Dual-Path/Multi-Functional Fine Pattern Generator Realizing High Accuracy Measurement for CMOS Image Sensor

2. Column parallel signal processing techniques for reducing thermal and RTS noises in CMOS image sensors;kawahito;Proc Int Image Sensor Workshop,2007

3. Noise reduction effects of column-parallel correlated multiple sampling and source-follower driving current switching for CMOS image sensors;kawahito;Proc Int Image Sensor Workshop,2009

4. Noise Analysis of High-Gain, Low-Noise Column Readout Circuits for CMOS Image Sensors

5. A 1.17-Megapixel CMOS Image Sensor With 1.5 A/D Conversions per Digital CDS Pixel Readout and Four In-Pixel Gain Steps

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