An ADC Test Technique With Dual-Path/Multi-Functional Fine Pattern Generator Realizing High Accuracy Measurement for CMOS Image Sensor
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Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9301474/9301477/09301531.pdf?arnumber=9301531
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A Low Power Digitizer with Piecewise- Linear Counting Technique for High Dynamic Range Nonacell-Based 3-D-Stacked CMOS Image Sensor;2023 IEEE International Symposium on Circuits and Systems (ISCAS);2023-05-21
2. A 30.2-µ Vrms Horizontal Streak Noise 8.3-Mpixel 60-Frames/s CMOS Image Sensor With Skew-Relaxation ADC and On-Chip Testable Ramp Generator for Surveillance Camera;IEEE Journal of Solid-State Circuits;2022-10
3. Circuit Techniques to Improve Low-Light Characteristics and High-Accuracy Evaluation System for CMOS Image Sensor;Sensors;2022-08-12
4. High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor;IEICE Transactions on Electronics;2022-07-01
5. A 0.7 μm-Pitch 108 Mpixel Nonacell-Based CMOS Image Sensor with Decision-Feedback Technique;2022 IEEE International Symposium on Circuits and Systems (ISCAS);2022-05-28
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