Author:
Gerardin S.,Bagatin M.,Paccagnella A.,Voss K.,Grurmann K.,Ferlet-Cavrois V.
Cited by
1 articles.
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1. Vertical Line Fault Mechanism Induced by Heavy Ions in an SLC NAND Flash;2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2019-09