Neutron-Induced Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage-Reference-Cited by-同舟云学术

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Neutron-Induced Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage

Published:2015-09 Issue: Volume: Page:
ISSN:
Container-title:2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
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Author:

Clemente Juan A.,Franco Francisco J.,Villa Francesca,Baylac Maud,Ramos Pablo,Vargas Vanessa,Mecha Hortensia,Agapito Juan A.,Velazco Raoul

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7365564/7365565/07365640.pdf?arnumber=7365640

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation;IEEE Transactions on Nuclear Science;2022-02

2. Impact of the Data Retention Threshold Voltage on the Cell-to-Cell SEU Sensitivity of COTS SRAMs;2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2021-09

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