CARMEN/MEX test board for the study of radiation effects on electronic components aboard JASON-2 and SAC-D satellites-Reference-Cited by-同舟云学术

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CARMEN/MEX test board for the study of radiation effects on electronic components aboard JASON-2 and SAC-D satellites

Published:2007-09 Issue: Volume: Page:
ISSN:
Container-title:2007 9th European Conference on Radiation and Its Effects on Components and Systems
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Author:

Bezerra Francoise,Lorfevre Eric,Ecoffet Robert,Falguere Didier,Bourdoux Philippe

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5175246/5205424/05205541.pdf?arnumber=5205541

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 14 Years of In-Flight Experimental Data on CARMEN-MEX;IEEE Transactions on Nuclear Science;2023-08

2. Proposal of a Lightened Radiation Hardness Assurance Methodology for New Space;2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2021-09

3. Analysis of single-event effects rate of K6R4016V1D chips applied in low Earth orbit;Chinese Journal of Space Science;2015

4. Low dose measurement with thick gate oxide MOSFETs;Radiation Physics and Chemistry;2012-03

5. Status of the T2L2/Jason2 Experiment;Advances in Space Research;2010-12

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