1. Fault Diagnosis for Resistive Random Access Memory and Monolithic Inter-Tier Vias in Monolithic 3-D Integration;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024-07
2. Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09
3. Device-Aware Diagnosis for Yield Learning in RRAMs;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25
4. A DfT Strategy for Guaranteeing ReRAM’s Quality after Manufacturing;Journal of Electronic Testing;2024-03-23
5. Memristors: Device Modeling, Design and Verification;2023 IEEE International Symposium on Smart Electronic Systems (iSES);2023-12-18