Author:
Iuculano Gaetano,Zanini Antonio
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality
Cited by
4 articles.
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1. Diode Laser Reliability Engineering Program;Semiconductor Laser Engineering, Reliability and Diagnostics;2013-01-24
2. Performance of parameter-estimates in step-stress accelerated life-tests with various sample-sizes;IEEE Transactions on Reliability;2002-09
3. 步進應力加速衰退試驗曁高可靠度產品壽命之硏究—以發光二極體爲例;Journal of the Chinese Institute of Industrial Engineers;1999-09
4. A Bayes approach to step-stress accelerated life testing;IEEE Transactions on Reliability;1996