Diode Laser Reliability Engineering Program
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Published:2013-01-24
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Page:325-353
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ISSN:
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Container-title:Semiconductor Laser Engineering, Reliability and Diagnostics
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Reference21 articles.
1. Optimum simple step-stress accelerated life tests with censoring
2. Learning Curve Approach to Reliability Monitoring
3. Epperlein P. W. Hawkridge A. R. andSkeats A.(2001).For further information seewww.pwe‐photonicselectronics‐issueresolution.com.