Evaluating Fault-Tolerant Techniques on COTS RISC-V NOEL-V Processor in Zynq UltraScale+ FPGA Under Proton Testing
Author:
Affiliation:
1. Programa de Pós-Graduação em Microeletrônica (PGMICRO), Instituto de Informática (INF), Universidade Federal do Rio Grande do Sul (UFRGS), Porto Alegre, Rio Grande do Sul, Brazil
Funder
European Union’s Horizon 2020 research and innovation programme
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Link
http://xplorestaging.ieee.org/ielx7/23/10221199/10138560.pdf?arnumber=10138560
Reference30 articles.
1. An ALU Protection Methodology for Soft Processors on SRAM-Based FPGAs
2. Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip
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