Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip-Reference-Cited by-同舟云学术

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Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip

Published:2022-10-19 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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Author:

Santos Douglas A.¹,Mattos Andre M. P.¹,Luza Lucas M.¹,Cazzaniga Carlo²,Kastriotou Maria²,Melo Douglas R.³,Dilillo Luigi¹

Affiliation:

1. University of Montpellier, CNRS,LIRMM,Montpellier,France

2. ISIS Facility, STFC, Rutherford Appleton Laboratory,United Kingdom

3. University of Vale do Itajaí,LEDS,Brazil

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9962319/9962334/09962335.pdf?arnumber=9962335

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Hybrid Hardening Approach for a Fault-Tolerant RISC-V System-On-Chip;IEEE Transactions on Nuclear Science;2024-08

2. A new linear path pair availability constraint for network design;Networks;2024-06-19

3. A New Reliability Analysis of RISC-V Soft Processor for Safety-Critical Systems;2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS);2024-04-03

4. Evaluating Fault-Tolerant Techniques on COTS RISC-V NOEL-V Processor in Zynq UltraScale+ FPGA Under Proton Testing;IEEE Transactions on Nuclear Science;2023-08

5. Using HARV-SoC for Reliable Sensing Applications in Radiation Harsh Environments;2023 9th International Workshop on Advances in Sensors and Interfaces (IWASI);2023-06-08

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