Affiliation:
1. School of Microelectronics, Xidian University, Xi’an, China
Funder
Special Project for Research and Development in Key areas of Guangdong Province
National Natural Science Foundation of China
Innovation Capability Support Program of Shaanxi
Fundamental Research Funds for the Central Universities
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
1 articles.
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1. The Degradation and Recovery of 1200-V SiC MOSFET with Different Total Ionizing Doses;2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS);2023-11-27