High-Resolution Alpha Spectrometry Using 4H-SiC Detectors: A Review of the State-of-the-Art

Author:

Mandal Krishna C.1ORCID,Chaudhuri Sandeep K.1ORCID,Ruddy Frank H.2ORCID

Affiliation:

1. Department of Electrical Engineering, University of South Carolina, Columbia, SC, USA

2. Ruddy Consulting, Mt. Pleasant, SC, USA

Funder

DOE Office of Nuclear Energy’s Nuclear Energy University Program

Advanced Support Program for Innovative Research Excellence-I&-II

University of South Carolina (USC), Columbia, USA

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Alpha Particle Detection Using Highly Rectifying Ni/Ga2O3/4H-SiC Heteroepitaxial MOS Junction;IEEE Transactions on Electron Devices;2023-12

2. High Resolution Metal-Oxide-4H-SiC detectors with various high-kdielectric oxide layers;2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD);2023-11-04

3. Effect of reverse voltage on alpha spectra of pre-conditioned Si PIN diodes deployed in vacuum/ambient environment;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2023-11

4. A New Strategy to Recover Threshold Voltage of SiC MOSFET After Gamma Radiation by Self-Heating in Circuit;2023 8th International Conference on Integrated Circuits and Microsystems (ICICM);2023-10-20

5. High Performance Pd/4H-SiC Epitaxial Schottky Barrier Radiation Detectors for Harsh Environment Applications;Micromachines;2023-07-30

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