Author:
Huang Chun-Ming,Wu Chien-Ming,Yang Chih-Chyau,Chien Wei-De,Chen Shih-Lun,Chen Chi-Shi,Wang Jiann-Jenn,Wey Chin-Long
Cited by
3 articles.
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1. Reliable High-Voltage Drain-Extended FinFET With Thermoelectric Improvement;IEEE Transactions on Electron Devices;2022-11
2. Uniform debugging interface for simulators;Proceedings of the Third International Conference on Advanced Informatics for Computing Research - ICAICR '19;2019
3. Platforms and Applications in Hardware Security: Trends and Challenges;International Journal of Security and Its Applications;2013-09-30