Author:
Zurla R.,Cabrini A.,Capecchi L.,Carissimi M.,Pasotti M.,Torelli G.
Cited by
1 articles.
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1. An Extended Temperature Range ePCM Memory in 90-nm BCD for Smart Power Applications;ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC);2022-09-19