C4NP technology: Manufacturability, yields and reliability

Author:

Perfecto Eric D.1,Hawken David1,Longworth Hai P.1,Cox Harry1,Srivastava Kamalesh1,Oberson Valerie2,Shah Jayshree1,Garant John1

Affiliation:

1. IBM Systems & Technology Group (STG), 2070 Route 52, Hopewell Junction, N.Y.12533, USA

2. IBM Canada, 23 Blvd de L'Aeroport, Bromont QC J2L 1A3, Canada

Publisher

IEEE

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Plating-free Bumping by Cu Nanopaste and Injection Molded Solder (IMS) for Fine Pitch Flip Chip Joining;2020 IEEE 70th Electronic Components and Technology Conference (ECTC);2020-06

2. Development of Liquid Photoresist for IMS (Injection Molded Solder) with High Thermal Stability;Journal of Photopolymer Science and Technology;2016

3. Technology Trends: Past, Present, and Future;Advanced Flip Chip Packaging;2013

4. Flip-Chip Interconnections: Past, Present, and Future;Advanced Flip Chip Packaging;2013

5. Development of an 18 × 18 mm package-on-package using C4NP flip chip attach and back side grind;2010 Proceedings 60th Electronic Components and Technology Conference (ECTC);2010

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