First Experimental Demonstration of MRAM Data Scrubbing: 80 Mb MRAM with 40 nm junctions for Last Level Cache Applications-Reference-Cited by-同舟云学术

First Experimental Demonstration of MRAM Data Scrubbing: 80 Mb MRAM with 40 nm junctions for Last Level Cache Applications

Published:2021-12-11 Issue: Volume: Page:
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Container-title:2021 IEEE International Electron Devices Meeting (IEDM)
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Author:

Wu H.¹,Katragadda V.¹,Evarts E.¹,Edwards E.¹,Southwick R.¹,Dutta A.¹,Lauer G.¹,Mehta V.¹,Johnson R.¹,van der Straten O.¹,Reznicek A.¹,Wordeman M.¹,Rizzolo M.¹,Patlolla R.¹,Metzler D.¹,Yang C.¹,Edelstein D.¹,Canaperi D.¹,Teehan S.¹,Slaughter J.M.¹,Worledge D.C.¹

Affiliation:

1. IBM Research,Albany,NY,12203

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9720433/9720494/09720539.pdf?arnumber=9720539

Reference12 articles.

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