Author:
Popovich M.,Friedman E.G.,Secareanu R.,Hartin O.L.
Cited by
2 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Effect of Power Supply Noise on Logical Reliability of MOS based Circuits;2023 Third International Conference on Advances in Electrical, Computing, Communication and Sustainable Technologies (ICAECT);2023-01-05
2. Programming scheme based optimization of hybrid 4T-2R OxRAM NVSRAM;Semiconductor Science and Technology;2017-08-29