Author:
Gharaybeh M.A.,Bushnell M.L.,Agrawal V.D.
Cited by
17 articles.
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1. On the Sensitization Probability of a Critical Path Considering Process Variations and Path Correlations;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2019-05
2. Pseudofunctional testing;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2006-08
3. Built-in sequential fault self-testing of array multipliers;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2005-03
4. Fault security analysis of CMOS VLSI circuits using defect-injectable VHDL models;Integration;2002-11
5. Path delay fault testing of multiplexer-based shifters;International Journal of Electronics;2001-08