Author:
Shaw Donald,Al-Khalili Dhamin,Rozon Come
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Software
Reference28 articles.
1. The quality and reliability of Intel's quarter micron process;Seshan;Int. Technol. J.,1998
2. Design of totally self-checking check circuits for m-out-of-n codes;Anderson;IEEE Trans. Comput.,1973
3. C. Bolchini, F. Salice, D. Sciuto, A TSC evaluation function for combinational circuits, Proceedings of the International Conference on Computer Design (ICCD)’97 Austin, U.S.A., 1997, pp. 555–560.
4. Fault modeling and logic simulation of CMOS and MOS integrated circuits;Wadsack;Bell System Tech. J.,l978
5. Physical versus logical fault models MOS LSI circuits;Galiay;IEEE Trans. Comput.,1980
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献