Author:
Imada H.,Fujisaki K.,Ohsawa T.,Tsuto M.
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A New ISA for High-Speed and Area-Efficient ALPG;IEEE Transactions on Circuits and Systems II: Express Briefs;2024-07
2. A Dedicated Memory Testing Processor Design;2023 IEEE 16th International Conference on Electronic Measurement & Instruments (ICEMI);2023-08-09
3. Instruction-based March Test Pattern Generation Scheme for At-Speed Test Cost Reduction;2023 International Conference on Artificial Intelligence in Information and Communication (ICAIIC);2023-02-20