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Failure analysis for full-scan circuits

Published: Issue: Volume: Page:
ISSN:
Container-title:Proceedings of 1995 IEEE International Test Conference (ITC)
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Author:

De K.,Gunda A.

Publisher

Int. Test Conference

Link

http://xplorestaging.ieee.org/ielx3/4046/11600/00529892.pdf?arnumber=529892

Cited by 21 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Sideway Scan, Solving the Achilles’ Heel of Scan-based Diagnosis;2024 IEEE International Test Conference in Asia (ITC-Asia);2024-08-18

2. Global Control Signal Defect Diagnosis in Volume Production Environment;2023 IEEE International Test Conference (ITC);2023-10-07

3. Diagnosing Double Faulty Chains through Failing Bit Separation;2022 IEEE International Test Conference (ITC);2022-09

4. Scan Chain Architecture with Data Duplication for Multiple Scan Cell Fault Diagnosis;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2022

5. Reconfigurable Scan Architecture for High Diagnostic Resolution;IEEE Access;2021

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