Author:
Leite Felipe G. H.,Santos Roberto B. B.,Medina Nilberto H.,Aguiar Vitor. A. P.,Giacomini Renato C.,Added Nemitala,Aguirre Fernando,Macchione Eduardo L.A.,Vargas Fabian,da Silveira Marcilei A. G.
Cited by
4 articles.
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1. Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Process;2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2022-10-19
2. General Purpose and Neural Network Approach for Benchmarking Microcontrollers Under Radiation;2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2021-09
3. Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs;Journal of Electronic Testing;2021-06
4. Characterization of Microcontroller Under Gamma Radiation Environment;Advances in Automation, Signal Processing, Instrumentation, and Control;2021