Ionizing radiation effects on a COTS low-cost RISC microcontroller-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Ionizing radiation effects on a COTS low-cost RISC microcontroller

Published:2017-03 Issue: Volume: Page:
ISSN:
Container-title:2017 18th IEEE Latin American Test Symposium (LATS)
language:
Short-container-title:

Author:

Leite Felipe G. H.,Santos Roberto B. B.,Medina Nilberto H.,Aguiar Vitor. A. P.,Giacomini Renato C.,Added Nemitala,Aguirre Fernando,Macchione Eduardo L.A.,Vargas Fabian,da Silveira Marcilei A. G.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7899159/7906734/07906762.pdf?arnumber=7906762

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Assessing the Impacts of Radiation-Induced Soft Errors on Arm Cortex-M Microprocessors;IEEE Transactions on Nuclear Science;2024-08

2. Reliability Assessment of Arm Cortex-M Processors under Heavy Ions and Emulated Fault Injection;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09

3. Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Process;2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2022-10-19

4. General Purpose and Neural Network Approach for Benchmarking Microcontrollers Under Radiation;2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS);2021-09

5. Failure Mechanism and Sampling Frequency Dependency on TID Response of SAR ADCs;Journal of Electronic Testing;2021-06

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP