Epoxy Molding Compound Filler Clogging Simulation During Integrated Circuit Encapsulation Process

Author:

Chen Bo-HengORCID,Hwang Sheng-JyeORCID,Chang Yu-Yang,Yang Yu-Shuo,Lee Huei-Huang,Huang Bing-Yuan,Hu Ian,Chen Dao-LongORCID,Tarng David,Hung C. P.ORCID

Funder

Advanced Semiconductor Engineering

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Electronic, Optical and Magnetic Materials

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Modeling the cure shrinkage–induced warpage of epoxy molding compound;International Journal of Mechanical Sciences;2024-04

2. An Improved Mold Flow Optimization Technology for High-Density Power Modules;2022 23rd International Conference on Electronic Packaging Technology (ICEPT);2022-08-10

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