Effect of Thermal and Mechanical Stresses on Novel Microstrip Lines Printed on Flexible Substrates

Author:

Obeidat Abdullah S.1ORCID,Enakerakpo Emuobosan1ORCID,Umar Ashraf2,Al-Shaibani Waleed1,Abdelatty Mohamed1ORCID,Lieberman Sara1ORCID,Noruz Shamsian Olya2ORCID,Al-Haidari Riadh1ORCID,Alhendi Mohammed1ORCID,Poliks Mark D.3ORCID

Affiliation:

1. Department of Systems Science and Industrial Engineering, The State University of New York, Binghamton, NY, USA

2. Department of Electrical and Computer Engineering, The State University of New York, Binghamton, NY, USA

3. Department of Systems Science and Industrial Engineering and the Materials Science and Engineering Program, The State University of New York, Binghamton, NY, USA

Funder

Honeywell Federal Manufacturing and Technologies, LLC, which operates the Kansas City National Security Campus for the United States Department of Energy/National Nuclear Security Administration

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

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