Potential-Induced Degradation (PID): Introduction of a Novel Test Approach and Explanation of Increased Depletion Region Recombination
Author:
Affiliation:
1. Fraunhofer Center for Silicon Photvoltaics CSP, Halle (Saale), Germany
2. Max Planck Institute of Microstructure Physics, Halle, Germany
3. Fraunhofer Institute for Mechanics of Materials IWM, Walter-Hülse-Str. 1, Halle (Saale), Germany
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/5503869/6800010/06779597.pdf?arnumber=6779597
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