Impact of partial shading on the performance and reliability of potential-induced degraded crystalline silicon PV module

Abstract

Potential-induced degradation shunting (PID-s) is a severe degradation mechanism that significantly impacts the performance and lifespan of photovoltaic (PV) modules. The impact of PID-s is further intensified when it coincides with partial shading. Despite its significance, limited research has been focused on the combined impact of PID-s and partial shading. Therefore, this work analyzes the impact of partial shading on the performance and reliability of PID-s-affected PV module. In the literature, PID-s is reported with two natures: Ohmic and non-Ohmic. This work considers the nature and severity of PID-s in the presented investigation. Results indicate that when an Ohmic PID-s-affected PV cell is shaded in a module, it results in less power loss than when a healthy cell is shaded, but it induces a significantly high reverse current through the PID-s-affected cell. With severity, the impact of Ohmic PID-s under shading decreases. In the case of non-Ohmic PID-s, severity does not impact the performance significantly; however, shading of a non-Ohmic PID-s affected cell is more severe than Ohmic PID-s until the PID-s threshold is reached. Furthermore, bypass diode activation is delayed in both types of PID-s compared to shading on healthy cells. Overall, these findings emphasize the significance of optimizing shading strategies and mitigating PID-s effects to enhance the performance and reliability of photovoltaics. This research provides valuable insights for industry stakeholders involved in PV installation and maintenance operations.