Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects-Reference-Cited by-同舟云学术

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Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects

Published:2012-06 Issue:2 Volume:61 Page:604-613
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:
Short-container-title:IEEE Trans. Rel.

Author:

Tsai Chih-Chun,Tseng Sheng-Tsaing,Balakrishnan Narayanaswamy

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx5/24/6205712/06198318.pdf?arnumber=6198318

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2. An EM‐based likelihood inference for degradation data analysis using gamma process;Applied Stochastic Models in Business and Industry;2024-08-12

3. Multiple stresses optimization design of constant-stress accelerated degradation test based on Wiener process;Proceedings of the Institution of Mechanical Engineers, Part O: Journal of Risk and Reliability;2024-07-25

4. On Alternative Monte Carlo Methods for Parameter Estimation in Gamma Process Models With Intractable Likelihood;IEEE Transactions on Reliability;2024

5. Optimizing two‐variable gamma accelerated degradation tests with a semi‐analytical approach;Naval Research Logistics (NRL);2023-11-08

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