Author:
Touba N.A.,McCluskey E.J.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Software
Cited by
42 articles.
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1. Storage-Based Logic Built-In Self-Test With Partitioned Deterministic Compressed Tests;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2023-09
2. Storage-Based Logic Built-In Self-Test With Cyclic Tests;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-09
3. Storage and Counter Based Logic Built-In Self-Test;IEEE Access;2023
4. Storage-Based Logic Built-In Self-Test with Variable-Length Test Data;2022 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2022-10-19
5. Test Point Insertion for Multi-Cycle Power-On Self-Test;ACM Transactions on Design Automation of Electronic Systems;2022-09-13