Improving Reliability of STT-MRAM-Based Smart Material Implication
Author:
Affiliation:
1. University of Calabria,Department of Computer Engineering, Modeling, Electronics and Systems,Rende,Italy
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10628446/10628545/10628831.pdf?arnumber=10628831
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1. A 28 nm Configurable Memory (TCAM/BCAM/SRAM) Using Push-Rule 6T Bit Cell Enabling Logic-in-Memory
2. Scaling-CIM: eDRAM In-Memory-Computing Accelerator With Dynamic-Scaling ADC and Adaptive Analog Operation
3. DIPER: Detection and Identification of Pathogens using Edit distance-tolerant Resistive CAM
4. A Reliable 8T SRAM for High-Speed Searching and Logic-in-Memory Operations
5. DASH-CAM: Dynamic Approximate SearcH Content Addressable Memory for genome classification;Jahshan,2023
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