An Optical Transceiver Reliability Study based on SFP Monitoring and OS-level Metric Data
Author:
Affiliation:
1. Huawei Technologies Duesseldorf GmbH,Munich,Germany,80992
2. Technical University of Munich,Chair of Computer Architecture and Parallel Systems,Germany
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10171437/10171438/10171587.pdf?arnumber=10171587
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1. Predicting DRAM-Caused Node Unavailability in Hyper-Scale Clouds
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