Future memory technology: challenges and opportunities-Reference-Cited by-同舟云学术

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Future memory technology: challenges and opportunities

Published:2008-04 Issue: Volume: Page:
ISSN:1930-885X
Container-title:2008 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
language:
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Author:

Kim Kinam

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/4522565/4530767/04530774.pdf?arnumber=4530774

Cited by 61 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Statistical modeling of degradation behavior in Split-Gate Non-Volatile memory devices;Solid-State Electronics;2024-01

2. Channel Modeling and Quantization Design for 3D NAND Flash Memory;Entropy;2023-06-21

3. CADEN: Compression-Assisted Adaptive Encoding to Improve Lifetime of Encrypted Nonvolatile Main Memories;IEEE Embedded Systems Letters;2023-03

4. All-spin PUF: An Area-efficient and Reliable PUF Design with Signature Improvement for Spin-transfer Torque Magnetic Cell-based All-spin Circuits;ACM Journal on Emerging Technologies in Computing Systems;2022-10-13

5. Pop-Crypt: Identification and Management of Popular Words for Enhancing Lifetime of EnCrypted Nonvolatile Main Memories;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2022-09

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