Mechanical Property Evolution in SAC+Bi Lead-Free Solders Subjected to Various Thermal Exposure Profiles
Author:
Affiliation:
1. Auburn University,Center for Advanced Vehicle and Extreme Environment Electronics (CAVE3),Auburn,AL,36849
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9816066/9816372/09816503.pdf?arnumber=9816503
Reference20 articles.
1. Aging and creep behavior of Sn3.9Ag0.6Cu solder alloy;xiao;Proc 54th Electronics Components Technology Conf,2004
2. Influence of reflow and thermal aging on the shear strength and fracture behavior of Sn-3.5Ag solder/Cu joints
3. Inhomogeneous deformation and microstructure evolution of Sn–Ag-based solder interconnects during thermal cycling and shear testing
4. Recrystallization and Precipitate Coarsening in Pb-Free Solder Joints During Thermomechanical Fatigue
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2. Mechanical Characterization and Modeling of iSAC Lead-Free Solder;2024 IEEE 74th Electronic Components and Technology Conference (ECTC);2024-05-28
3. The Effects of Thermal Exposure on the Creep Behavior of SAC+Bi Lead-Free Solders;2023 22nd IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm);2023-05-30
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