Tunable Piezoresistive NEMS Pressure Sensor Simulation Under Various Environmental Conditions
Author:
Affiliation:
1. Centre for Applied Research in Electronics, Indian Institute of Technology Delhi, New Delhi, India
2. School of Engineering, Macquarie University, Sydney, NSW, Australia
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Instrumentation
Link
http://xplorestaging.ieee.org/ielx7/7782634/10180123/10198558.pdf?arnumber=10198558
Reference19 articles.
1. Electro-Thermal Characteristics of Junctionless Nanowire Gate-All-Around Transistors Using Compact Thermal Conductivity Model
2. Thermal Conductivity Model to Analyze the Thermal Implications in Nanowire FETs
3. Minimum detectable strain improvement in junctionless nanowire FET sensors
4. Piezoresistive Sensing Performance of Junctionless Nanowire FET
5. Nanowire transistors without junctions
Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A Multi‐Directional GaN/TiO2 Cuboidal Nanowire Junctionless FET‐Based Ultra‐High Pressure Sensor: A Design Perspective;Advanced Theory and Simulations;2024-08-08
2. Leakage Current and Hot-Carrier Injection in the Junctionless Nanowire FETs Enhanced by Tensile Mechanical Stress;IEEE Transactions on Electron Devices;2024-07
3. Piezoresistive sensitivity enhancement below threshold voltage in sub-5 nm node using junctionless multi-nanosheet FETs;Nanotechnology;2024-05-30
4. Modeling of inner-outer gates and temperature dependent gate-induced drain leakage current of junctionless double-gate-all-around FET;Microelectronics Journal;2024-04
5. Self-Heating Mapping of the Experimental Device and Its Optimization in Advance Sub-5nm Node Junctionless Multi-Nanowire FETs;IEEE Transactions on Device and Materials Reliability;2023
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3