Author:
Unno Y.,Kohriki T.,Kendo T.,Iwasaki H.,Terada S.,Takahata M.,Tamura N.,Maeohmichi H.,Ohmoto T.,Yoshikawa M.,Ohyama H.,Handa T.,Iwata Y.,Ohsugi T.,Haber C.,Siegrist J.,Spieler H.,Dubbs T.,Grillo A.,Hubbard B.,Kashigin S.,Kroeger W.,Noble K.,O'Shaughnessy K.,Pulliam T.,Rowe W.A.,Sadrozinski H.F.-W.,Seiden A.,Spencer E.,Webster A.,Wichmann R.,Wilder M.,Takashima R.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Evaluation of radiation damaged p-in-n and n-in-n silicon microstrip detectors;IEEE Transactions on Nuclear Science;1999-12
2. Silicon microstrip detectors in high luminosity application;IEEE Transactions on Nuclear Science;1998-06
3. Beam test of the ATLAS silicon detector modules;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1998-05
4. Performance of the ATLAS silicon strip detector modules;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1998-02
5. Beam test of a large area n-on-n silicon strip detector with fast binary readout electronics;IEEE Transactions on Nuclear Science;1997-06