Author:
Unno Y.,Nakao M.,Fujita K.,Ciocio A.,Dane J.,Dubbs T.,Emes J.,Gilchriese M.,Grillo A.,Haber C.,Handa T.,Holland S.,Iwasaki H.,Iwata Y.,Kashigin S.,Kipnis I.,Kohriki T.,Kondo T.,Kroeger W.,Lozano-Bahilo J.,Moorhead G.,Ohsugi T.,Pier S.,Rowe B.,Sadrozinski H.F.W.,Shapiro M.,Siegrist J.,Spencer E.,Spieler H.,Tamura N.,Takashima R.,Terada S.,Wilder M.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Nuclear Energy and Engineering,Nuclear and High Energy Physics
Cited by
3 articles.
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1. Novel p-stop structure in n-side of silicon microstrip detector;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;2005-04
2. Evaluation of radiation damaged p-in-n and n-in-n silicon microstrip detectors;IEEE Transactions on Nuclear Science;1999-12
3. The ATLAS Semiconductor Tracker;Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment;1998-05