Analysis of Nonideal Behaviors Based on INL/DNL Plots for SAR ADCs-Reference-Cited by-同舟云学术

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Analysis of Nonideal Behaviors Based on INL/DNL Plots for SAR ADCs

Published:2016-08 Issue:8 Volume:65 Page:1804-1817
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Huang Chun-Po^ORCID,Ting Hsin-Wen,Chang Soon-Jyh

Funder

Ministry of Science and Technology, Taiwan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/7509710/07470271.pdf?arnumber=7470271

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. ADC Static Test System Based on LabVIEW Platform;2023 8th International Conference on Integrated Circuits and Microsystems (ICICM);2023-10-20

3. A 0.6-V 12-bit Set-and-Down SAR ADC With a DAC-Based Bypass Window Switching Method;IEEE Transactions on Circuits and Systems II: Express Briefs;2023-09

4. A 12-Bit Low-Input Capacitance SAR ADC With a Rail-to-Rail Comparator;IEEE Access;2023

5. A 16-bit 2.5-MS/s SAR ADC with on-chip foreground calibration;Microelectronics Journal;2022-12

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