Multiphysics Simulation of EM Side-Channels from Silicon Backside with ML-based Auto-POI Identification-Reference-Cited by-同舟云学术

Multiphysics Simulation of EM Side-Channels from Silicon Backside with ML-based Auto-POI Identification

Published:2021-12-12 Issue: Volume: Page:
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Container-title:2021 IEEE International Symposium on Hardware Oriented Security and Trust (HOST)
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Author:

Lin Lang¹,Zhu Deqi¹,Wen Jimin¹,Chen Hua¹,Lu Yu¹,Chang Norman¹,Chow Calvin¹,Shrivastav Harsh¹,Chen Chia-Wei²,Monta Kazuki³,Nagata Makoto³

Affiliation:

1. ANSYS Inc.,USA

2. National Taiwan University,Taiwan

3. Kobe University,Japan

Publisher

IEEE

Link

Reference25 articles.

2. Extracting Physical IC Models Using Near-field Scanning;yu;IEEE International Symposium on Electromagnetic Compatibility (EMC),0

5. A Testing Methodology for Side Channel Resistance Validation;goodwill;NIST Non-invasive Attack Testing Workshop,0

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5. Potential of Unsupervised Deep Learning for Detection of EM Side-Channel Attacks;2023 IEEE Physical Assurance and Inspection of Electronics (PAINE);2023-10-24