A Formal Approach to Improve Connectivity Coverage in DFD, DFT, DFM, and DFX Domain
Author:
Affiliation:
1. Intel Technology Private Limited,NES,Bangalore,India
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10235328/10235351/10235687.pdf?arnumber=10235687
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1. A new framework for analyzing test generation and diagnosis algorithms for wiring interconnects
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