Ir Film Structural Properties for TES Application-Reference-Cited by-同舟云学术

Ir Film Structural Properties for TES Application

Published:2023-08 Issue:5 Volume:33 Page:1-4
ISSN:1051-8223
Container-title:IEEE Transactions on Applied Superconductivity
language:
Short-container-title:IEEE Trans. Appl. Supercond.

Author:

Ferrari Barusso L.¹^ORCID,Tugliani S.²^ORCID,Fedkevych M.³^ORCID,Celasco E.¹^ORCID,Gallucci G.⁴^ORCID,Grosso D.¹,Manfrinetti P.⁵^ORCID,Niazi K.⁵,Gatti F.¹^ORCID

Affiliation:

1. Università di Genova and INFN Genova, Genoa, Italy

2. Università di Torino, Turin, Italy

3. Department of Physics and Astronomy, The University of Alabama, Tuscaloosa, AL, USA

4. INFN Genoa, Genoa, Italy

5. Università di Genova, Genova, Italy

Funder

Italian Space Agency ASI

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/77/10024526/10073561.pdf?arnumber=10073561

Reference10 articles.

1. Low-temperature deposition of iridium thin films by pulsed laser deposition

2. Effect of the deposition temperature on the properties of iridium thin films grown by means of pulsed laser deposition

3. X-ray diffraction analysis by Williamson-Hall, Halder-Wagner and size-strain plot methods of CdSe nanoparticles- a comparative study

4. The Demonstration Model of the ATHENA X-IFU Cryogenic AntiCoincidence Detector

5. The Phonon-Mediated TES Cosmic Ray Detector for Focal Plane of ATHENA X-Ray Telescope

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