Influence of Edge Crack Propagation on Critical Current Degradation of REBCO Tape Studied by Phase-Field Fracture Method and Current Shunting Model
Author:
Affiliation:
1. High Magnetic Field Laboratory, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China
2. School of Civil Engineering, Fujian University of Technology, Fuzhou, China
Funder
HFIPS Director's Fund
Hefei Comprehensive National Science Center
High Magnetic Field Laboratory of Anhui Province
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/77/9975166/09963572.pdf?arnumber=9963572
Reference44 articles.
1. Internal residual strain and critical current maximum of a surrounded Cu stabilized YBCO coated conductor
2. A phase-field description of dynamic brittle fracture
3. Revisiting brittle fracture as an energy minimization problem
4. Role of the Complex Interface Between Bi2Sr2CaCu2Ox Filaments and the Ag Matrix in the Mechanical and Electrical Behaviors of Composite Round Wires
5. Influences of cracking of coated superconducting layer on voltage-current curve, critical current, and n-value in DyBCO-coated conductor pulled in tension
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