An AHP-Based Defect Detection Algorithm Study for E-paper Pockmarks Detection
Author:
Affiliation:
1. Guangzhou Institute of Advanced Technology,Guangzhou,China
2. Taiyuan University of Science and Technology,Taiyuan,China
3. Wuyi University,Jianmen,China
Funder
Research and Development
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx8/10608459/10608497/10608592.pdf?arnumber=10608592
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4. Ultrathin silicon wafer defect detection method based on IR micro-digital holography
5. Electronic component detection based on image sample generation
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