Remaining Useful Life Prediction of IGBT Module Based on Particle Filter Combining with Particle Swarm Optimization
Author:
Affiliation:
1. China Academy of Space Technology,China Aerospace Components Engineering Center,Beijing,China
2. Beihang University,School of Reliability and Systems Engineering,Beijing,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9808358/9808447/09808667.pdf?arnumber=9808667
Reference10 articles.
1. Physics-of-Failure, Condition Monitoring, and Prognostics of Insulated Gate Bipolar Transistor Modules: A Review
2. Analysis of the degradation mechanisms occurring in the topside interconnections of IGBT power devices during power cycling
3. A Lumped Thermal Model Including Thermal Coupling and Thermal Boundary Conditions for High-Power IGBT Modules
4. Auxiliary Particle Filtering-Based Estimation of Remaining Useful Life of IGBT
5. Fault Detection Circuit Based on IGBT Gate Signal
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1. Online Short-Term Aging Status Prediction of SiC MOSFETs for DC Solid-State Power Controller Using Adaptive Variable Time-Steps Metabolic Gray Model;IEEE Transactions on Power Electronics;2024-10
2. A Data-Driven Approach for Power IGBT Operation State Prediction Based on Domain Adapted BiLSTM Networks;2023 International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD);2023-11-02
3. Data-driven Prognostic for IGBT Failure Precursor Parameter Based on Informer;2022 5th International Conference on Computing and Big Data (ICCBD);2022-12-16
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