A 1700 V-Class Self-Aligned Channel and Split Gate (SASG) Architecture of 4H-SiC VDMOSFET for High Frequency Application
Author:
Affiliation:
1. Hon Hai Research Institute,Semiconductor Research Center,Hsin Chu,Taiwan
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10261884/10261892/10261901.pdf?arnumber=10261901
Reference6 articles.
1. A Channel Self-Alignment process for High-Voltage VDMOSFETs in 4H-SiC
2. A Self-Aligned Process for High-Voltage, Short-Channel Vertical DMOSFETs in 4H-SiC
3. Split-Gate 1.2-kV 4H-SiC MOSFET: Analysis and Experimental Validation
4. Device Design Consideration for Robust SiC VDMOSFET With Self-Aligned Channels Formed by Tilted Implantation
5. A novel 4H-SiC MOSFET for low switching loss and high-reliability applications
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