Comparing Hexagonal and Circular Cell designs for SiC MPS Diode: The Curvature Effect on Avalanche Capability
Author:
Affiliation:
1. College of Electrical Engineering, Zhejiang Univerisity,Hangzhou,China
Funder
Guangdong Key Research and Development Program of China
National Natural Science Foundation of China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9655996/9655997/09656034.pdf?arnumber=9656034
Reference12 articles.
1. A Surge Current Stable and Avalanche Rugged SiC Merged pn Schottky Diode Blocking 600V Especially Suited for PFC Applications
2. 1.2-kV 4H-SiC Merged PiN Schottky Diode With Improved Surge Current Capability
3. Junction Temperatures under Breakdown Condition
4. An Analytical Model With 2-D Effects for 4H-SiC Trenched Junction Barrier Schottky Diodes
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